2023 Poster – Parent-child reflections about multiple visits to a museum tinkering exhibit

April 20th, 2023 | RESEARCH

Tinkering experiences in informal learning spaces can engage families in engineering practices and support learning (Pagano et al., 2020). Further, reflections after informal learning experiences can reveal and extend children’s memory and learning (Pagano et al., 2019), but reflections vary by age, culture, setting, program, and other factors (Fivush et al., 2006). We examined how the conversational structure and engineering content of families’ reflections vary across multiple museum visits and across different types of tinkering programs (e.g., open-ended vs. function-focused).

Document

MPA-2023-TALES-Repeat-Visitor-Poster-.pdf

Team Members

Riley George, Author, Loyola University Chicago
Beatrice Bailey, Author, Northwestern University
Lauren Pagano, Author, Northwestern University
Catherine Haden, Author, Loyola University Chicago

Funders

Funding Source: NSF
Funding Program: Advancing Informal STEM Learning (AISL)
Award Number: 1906839

Funding Source: NSF
Funding Program: Advancing Informal STEM Learning (AISL)
Award Number: 1906940

Funding Source: NSF
Funding Program: Advancing Informal STEM Learning (AISL)
Award Number: 1906808

Related URLs

Collaborative Research: Making Space for Story-Based Tinkering to Scaffold Early Informal Engineering Learning

Tags

Audience: Educators | Teachers | Elementary School Children (6-10) | Evaluators | Families | Learning Researchers | Museum | ISE Professionals
Discipline: Education and learning science | Engineering
Resource Type: Conference Proceedings | Reference Materials
Environment Type: Exhibitions | Making and Tinkering Programs | Museum and Science Center Exhibits | Public Programs

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This material is supported by National Science Foundation award DRL-2229061, with previous support under DRL-1612739, DRL-1842633, DRL-1212803, and DRL-0638981. Any opinions, findings, conclusions, or recommendations contained within InformalScience.org are those of the authors and do not necessarily reflect the views of NSF.

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