Taking Risks: A Common Theme for the Winners of the 23rd Annual Excellence in Exhibition Competition

January 1st, 2011 | RESEARCH

In this article, Rita Mukherjee Hoffstadt, Assistant Director for Traveling Exhibits and Special Projects at The Franklin Institute, summarizes the conversations discussed at the American Association of Museums (AAM) awards session for the 23rd Annual Excellence in Exhibition Competition held at the AAM annual conference in Houston, Texas in May 2011. The winners all embraced and managed an element of risk in the process of creating their exhibitions.

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Rita Mukherjee Hoffstadt, Author, Franklin Institute

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Publication: Exhibitionist
Page(s): 8

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Audience: Museum | ISE Professionals
Discipline: Education and learning science | General STEM | Geoscience and geography | History | policy | law | Life science
Resource Type: Peer-reviewed article | Research Products
Environment Type: Exhibitions