Assessing Excellence in Exhibitions: Three Approaches

July 1st, 2007 | RESEARCH

In this article, Alan Teller Partner at Teller Madsen, highlights the major points of a forum on exhibition evaluation at the AAM Conference in Chicago. The forum focused on three distinct approaches: the Execellent Judges Framework, Independent Critic's approach, and Summative Evaluation approach. Challenges and opportunities of each approached are discussed and are regarded as tools for museum evaluators.

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Team Members

Alan Teller, Author, Teller Madsen

Citation

Publication: Exhibitionist
Volume: 26
Number: 2
Page(s): 69

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Audience: Evaluators | Museum | ISE Professionals
Discipline: Education and learning science
Resource Type: Mass Media Article | Reference Materials
Environment Type: Exhibitions | Museum and Science Center Exhibits